Application of Powder X-Ray Diffraction Studies for Single Crystals

Powder X-Ray Diffraction (PXRD) is an analytical technique that employs X-Rays to investigate the molecular and crystallographic structures of substances. This technique identifies phases, determines unit cells, and examines microstructure. When the incident X-Ray beam strikes the sample, it generates intense reflected Xrays via constructive interference, as long as the conditions satisfy Bragg’s Law. This law explains the correlation between the wavelength of the incoming X-rays, the angle at which the beam strikes, and the spacing of the atomic lattice planes. PXRD provides many benefits, such as non-destructive testing, high sensitivity and reliability, easy sample preparation, user-friendly systems, convenient operational processes, quick processing times, excellent resolution, low maintenance expenses, suitable automation features, and simple data interpretation, making it applicable for both qualitative and quantitative analyses in various fields. PXRD is a very useful technique in accessing the preferred orientation of the grown single crystals.