Characterization of Single Crystals by High-Resolution X-Ray Diffractometry and X-Ray Topography

Well-characterized single crystals are the building blocks of advanced technologies of modern science. High-resolution X-ray diffraction (HRXRD), Diffuse X-ray scattering (DXS) and X-ray topography (XRT) methods play an important role in evaluating the crystalline perfection of single crystals because of their non-destructive nature and accuracy. These methods are useful to get the real knowledge about the arrangement of atoms/molecules/ions including dopants. Macroscopic defects like dislocations, structural grain boundaries and microscopic defects like point defects and their aggregates, crystallographic orientation of the surface bending of crystallographic planes etc, can be characterized by HRXRD, XRT and DXS