Third-Order Nonlinear Optics: Characterization Tools and Applications
Abstract
Nonlinear optics (NLO) explores the unique behaviours of materials when exposed to high-intensity
light, leading to a range of phenomena where the response of the material is nonlinear in relation to the
applied field. Among the different techniques available to characterize the third-order NLO properties of the materials, Z-scan technique is noteworthy. This chapter provides an overview of fundamentals of NLO processes, third-order NLO properties and Z-scan experiment, and discusses their application in the design of optical limiters, optical switches, and high-density data storage devices. By examining recent advancements in NLO material research and device technology, in this chapter highlights the growing impact of third-order nonlinear optics on fields such as telecommunications, data storage, and optical safety devices, underscoring its role in the evolution of next-generation photonic technologies.