Third-Order Nonlinear Optics: Characterization Tools and Applications

Authors

G. Vinitha
Department of Physics, School of Advanced Sciences, Vellore Institute of Technology, Chennai-600127, Tamil Nadu, India. Email: vinitha.g@vit.ac.in
T.C. Sabari Girisun
Nanophotonics Laboratory, Department of Physics, Bharathidasan University, Tiruchirappalli-620024, Tamil Nadu, India. Email: sabarigirisun@bdu.ac.in

Abstract

Nonlinear optics (NLO) explores the unique behaviours of materials when exposed to high-intensity
light, leading to a range of phenomena where the response of the material is nonlinear in relation to the
applied field. Among the different techniques available to characterize the third-order NLO properties of the materials, Z-scan technique is noteworthy. This chapter provides an overview of fundamentals of NLO processes, third-order NLO properties and Z-scan experiment, and discusses their application in the design of optical limiters, optical switches, and high-density data storage devices. By examining recent advancements in NLO material research and device technology, in this chapter highlights the growing impact of third-order nonlinear optics on fields such as telecommunications, data storage, and optical safety devices, underscoring its role in the evolution of next-generation photonic technologies.

Published

January 3, 2025

Categories

How to Cite

G. Vinitha, & T.C. Sabari Girisun. (2025). Third-Order Nonlinear Optics: Characterization Tools and Applications. In Dr. Muthu Senthil Pandian & Dr. P. Ramasamy (Eds.), CHARACTERIZATION OF SINGLE CRYSTALS (pp. 465-490). Royal Book Publishing. https://doi.org/10.26524/225.26